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Oral presentation

Development of analysis method to predict the state of deformation and fracture using synchrotron radiation during the fracture test of Simulated Debridement

Tominaga, Aki; Shobu, Takahisa; Satou, Yukihiko; Shiro, Ayumi*; Kuwatsuru, Osamu*; Uno, Masayoshi*

no journal, , 

During the fracture test of the simulated debris, the internal deformation and the strain were evaluated by X-ray CT and X-ray diffraction using synchrotron radiation source, respectively. The purpose of this study is to determine the fracture strength of the debris, the prediction of which is thought to be difficult, from the CT images and strain amounts during the fracture test. We'll report the results of measurements using synchrotron X-ray CT and diffraction at the JAEA beamline BL22XU on SPring-8. ZrO$$_{2}$$ phase, Al$$_{2}$$O$$_{3}$$ phase, and voids were observed in the CT image. In the strain analysis by X-ray diffraction of this sample was obtained from the average strain of the sample flat plate with the thickness of about 0.1 mm including the center of the sample. We consider that the difference between the macrostrain and microstrain is the amount of void deformation.

Oral presentation

Observation of spin-polarized Weyl cones and half-metallicity in the quaternary Heusler Co$$_2$$Mn(Al,Si) thin films

Sumida, Kazuki; Kakoki, Masaaki*; Sakuraba, Yuya*; Kono, Takashi*; Goto, Kazuki*; Miyamoto, Koji*; Hono, Kazuhiro*; Okuda, Taichi*; Kimura, Akio*

no journal, , 

no abstracts in English

Oral presentation

Development of microbeam system at SPring-8 JAEA beamline BL22XU

Tanida, Hajime; Tsuji, Takuya; Kobata, Masaaki; Kitagaki, Toru

no journal, , 

In the decommissioning of Fukushima Daiichi Nuclear Power Plant, analysis of fuel debris is extremely important to understand its properties. The fuel debris to be removed on a trial basis and the samples available for analysis are expected to be fine particles. In the case of relatively large samples, handling becomes difficult due to the dose problem. Non-destructive X-ray analysis using X-rays is an effective analysis method for such samples, but in order to apply it to fine particles, X-rays must be focused to the micrometer order. For this purpose, a Kirkpatrick-Baez (KB) mirror was installed in the experimental hutch 3 of the RI building of the JAEA beamline BL22XU, which has a hard X-ray undulator as a light source, at SPring-8.

Oral presentation

Study of crystal field-phonon binding in CeAs by inelastic X-ray scattering

Arai, Yosuke*; Kuroda, Kenta*; Tsutsui, Satoshi*; Hirai, Daigoro*; Katayama, Wago*; Shin, S.*; Kubota, Masato; Nomoto, Takuya*; Suzuki, Hiroyuki*; Miyasaka, Shigeki*; et al.

no journal, , 

no abstracts in English

Oral presentation

Prospects for spintronics by high-resolution spectroscopy

Mori, Michiyasu

no journal, , 

no abstracts in English

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